Advanced SMUs

Advanced Pulse-Enabled SMU

  • 4x or 8x integrated channels, rack-mount or benchtop configurations
  • ±10V and 0-40V source and measure ranges
  • Isolated channel outputs
  • Up to 3A per channel (5A in pulsed mode)
  • 1μV and sub 1pA sense resolution
  • Differential (Kelvin) sensing inputs
  • Fast-sampling up to 2Msps
  • Adjustable pulse rise and fall times

EECL’s Advanced Source-Measure Unit (SMU) is a 4 or 8 channel SMU, whose outputs include a ±10V bipolar mode, and a 0-40V high voltage range, capable of supplying 3A each (up to 5A in pulsed mode).
With 1μV and sub 1pA sense resolution, fast-sampling (up to 2MSPS), and pulse modes with adjustable durations and rise/fall times, the SMU offers a one-product solution for even the most complex measurement problems in semiconductor device characterization, quantum computing, etc. 

What Sets Us Apart

  • Fast Pulsing (down to 10μs durations), with intelligent adjustable pulse slopes
  • Optimized software and hardware capabilities for applications such as RF device biasing /characterization and quantum computing
  • Thermal Stability, enabled by integrated oven-based temperature control
  • Easy to use software control options
  • Open Source Device Firmware - allows for customization for user applications

The SMU module is priced at 3,300 GBP per channel for a 4 channel box and 2,900 GBP per channel for an 8 channel box. We offer tiered volume discounts for bulk orders of our rack-mounted modules. Contact us to discuss possibilities.

Datasheet
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Detailed Specifications

  • 4x or 8x integrated and synchronized channels
  • Isolated channel outputs
  • ±10V or 0-40V source and measure ranges
  • Up to 3A per channel (5A in pulsed mode)
  • 1μV and sub 1pA sense resolution
  • Fast-sampling modes up to 2Msps
  • Differential (Kelvin) Sensing Inputs
  • Adjustable pulse durations (down to 1us), with adjustable pulse edge slopes
  • Trigger In/Out connections for fast, externally controlled sequencing
  • RF Transistor Biasing and Characterization
  • Quantum Computing
  • Semiconductor Measurements
  • Gate Leakage Measurements
  • Automated Test
  • Flying Probe Testers
  • On-Wafer Testing
  • RF Development, Board Bring Up
  • Battery and IOT Characterization, Battery Simulation

A simplified (equivalent) system block diagram of the converter is shown below:

EECL provides a wide suite of available software control options, including both graphical user interfaces (GUIs) and scripting libraries. Options include, but are not limited to:

  • Windows GUI
  • Web Server GUI (no installation needed)
  • Matlab
  • Python
  • LabVIEW
  • Custom software - get in touch!

Unit dimensions are as shown below:

Get in touch

Contact us to discuss how our experienced team can help solve your next challenge

Contact us today

info@euroecl.com

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+44(0) 203 6677 196

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