EECL’s Advanced Source-Measure Unit (SMU) is a 4 or 8 channel SMU, whose outputs include a ±10V bipolar mode, and a 0-40V high voltage range, capable of supplying 3A each (up to 5A in pulsed mode).
With 1μV and sub 1pA sense resolution, fast-sampling (up to 2MSPS), and pulse modes with adjustable durations and rise/fall times, the SMU offers a one-product solution for even the most complex measurement problems in semiconductor device characterization, quantum computing, etc.
The problems associated with multiple SMUs are gone with this device as they are all synchronized a single high performance motherboard with all ground loops and inaccuracies removed. Multiple users can remote in at the same time for independent measurements.
A simplified (equivalent) system block diagram of the converter is shown below:
EECL provides a wide suite of available software control options, including both graphical user interfaces (GUIs) and scripting libraries. Options include, but are not limited to:
Unit dimensions are as shown below:
