Ultra-Precise ATE FocusedQuad Power Supply Module and Device Analyser

Introducing the picoSight X4

This versatile and durable module provides four channels of bipolar, low-noise ±10V power output, with 1 Amp per channel, and instrumentation-grade control. It supports both constant and pulsed power supplies (up to 5 Amps pulsed) and is optimized for advanced scientific applications, including semiconductor analysis, battery simulation, RF device biasing, and quantum technology.

Each channel features high-resolution ±20V analogue inputs that can be configured for either measurement or voltage sensing. Precise current measurements, from 5A down to 1pA, enable resistances exceeding 10 G-Ohms to be measured, all at an impressive sampling rate of 1 million samples per second. Pulse durations range from 1 microsecond to unlimited lengths, with intelligently adjustable pulse slopes to mitigate cable inductance. Multiple units can be stacked, offering synchronized operation with hundreds of channels, while trigger in/out connections allow for precise timing control.

Equipped with robust onboard processing, the module offers seamless integration into automated test setups through USB or Ethernet interfaces, with support for C, LabView, and MATLAB for fast, efficient control technology.

Detailed Description

This module consolidates the functionality of multiple power supplies and multimeters into a single, high-performance system, delivering superior performance at a fraction of the cost compared to traditional desktop setups. It also eliminates the hassle of cable clutter and current loops. With onboard filtering, the module effectively removes RF noise that typically couples with circuits and cables. The power supply is fully isolated, with a shared ground across all four channels, eliminating the mains noise commonly found in standard setups (as shown below). A unified interface allows for quick, simultaneous control of all supplies, enabling fast and efficient measurements across any configuration.

The hardware is highly adaptable, allowing reconfiguration with new processing algorithms. Its interconnected design supports a wide range of intelligent operations. It can function as a basic power supply, current sensing, and I/O card, or be reconfigured for advanced tasks such as amplifier bias control, transistor IV curve measurement, leakage current testing, and detecting potential static damage in devices. Pulse measurements, for high-power devices, can be conducted with pulse durations from 1 µS and longer.

The system is capable of collecting data from various sources, with an interface protocol that ensures simultaneous data transfer. It also includes a configurable audible alarm for alerts related to overcurrent, specific input voltages, or digital events. LED indicators provide clear visibility of all external connections, making it easy to monitor the module’s status at a glance.

  • GaN Device Characterisation
  • Transistor Measurements
  • Gate Leakage Measurements
  • Semiconductor Measurement
  • Transistor Biasing
  • Automated Test
  • Flying Probe
  • RF Development
  • Board Bring Up
  • On-Wafer Testing
  • Scientific Measurements
  • Quantum Computing
  • Battery & IOT Characterisation
  • 4 Channel Battery Simulation
  • Low-Cost Batch Production Test

Constant Voltage, Current and Power Mode

The module can control the output to be either constant voltage or constant current. When switching between these modes the device limits overshoot and protects the DUT. Custom software modules can be added to provide any simulation of power interface that may be required.

Pulse Measurement Capability

The power line outputs can be pulsed to measure high power devices. Pulse lengths upwards of 1us can be made. Maximum voltage rise/fall time is 10V in 100nS. 1MSPS of voltage and current are made during the pulses.

Controllable Start / Stop Rate (soft start)

The module can be configured for immediate or slow ramping to achieve the target output voltage. This is especially useful to minimise overshoot when high inductance lines are present.

Sequence Programming using Trigger In / Out

The module can be pre-programmed with a sequence of measurements, events and sweeps. The unit can be triggered enabling fast and aligned sequencing through large numbers of tests. Onboard memory is available for collection of large amounts of sample data.

Fast Sequence Sweeping

Voltage / Current for quick device characterisation. IV curves can be taken for transistors, diodes and any semiconductor devices enabling leakage, ESD damage or verification of bond wire attachment. Multiple pins can be sweeps concurrently enabling ultra-fast die measurement. Analog Input can be used within the sequencing – for example diode measurement.

Programable Measurement Settle Time

The dwell time for a current or voltage sweep can be programmed to ensure the DUT is fully settled. This control can also be automated to ensure all data points are steady state measurements. This process ensures the most rapid of sweeps.

Accumulated Charge Measurements

for IOT and Accurate Battery Simulation. The unit can simulate accurate batteries for IOT measurements and assessment of battery performance under various conditions. The unit can detect Pico amp current draw with averaging and hundreds of samples / second allowing even the fastest of current blip to be measured.

Software Applications

is available for basic control and quick start of the unit. The unit can also be easily communicated with options using GPIB, RS232, USB, Ethernet via all programming environments (C / Matlab / Labview etc).

Additional Functionality

We can add as you require further software tools to enable any specific requirements that you may have, contact us for more information.

DC Outputs4 x -10V to +10V 1A Supplies with ground provided over BNC. Voltage or Current Modes & Pulsed Measurements.
Configurable Ramp Rates and Current Limiting.  Other features available on request by way of software updates.
DC Step Size300µV Step Size on Voltage Outputs.
DC AccuracyXFET Reference, MAX 3ppm/C, ±0.05%.
Current Measurement1pA to 1A with 28bit log scale accuracy.  Pulse measurement up to 5A for 100uS.
Sample RateSimultaneous measurement of all currents and analogue inputs, up to 10kSPS. Pulse measurement 1uS sample rate (1M samples per second)
Analogue Inputs±20V Range with 24bit Resolution. BNC
Digital Ports8 Reconfigurable pins as I/O, I2C, RS232, SPI, etc. Power Rail Configurable between 2.0V and 5.5V. 20 MHz Digital IO Speed per pin.
Control OptionsControl via Ethernet or USB (RS232).
Power20V – 3A Max. Total Power Output: 40W (10W per channel)
MinimumTypicalMaximum
Operating Temperature 10°C 40°C
Humidity 10% 80%
DC Jack Input Voltage 16V 50V
Idle Power Consumption 2W
Output Power, max continuous 24W
Output Power, max peak 80W
Output Voltage -10.0V 10.0V
Output Voltage Resolution 250µV
Output Current 0 1A *5A
Current Measurement Resolution1pA, 28bit log scale to 5Amps. Negative and Positive Current
Current Measurement Range 1 pA *5A
Pulse Measurement Width 2uS Inf
Pulse Rise Time 100nS Inf
Pulse Current Sampling Rate 1 Msps
Standard Sampling Rate (Constant) 20 ksps
* – Only Available in Pulse Mode

The information contained in this datasheet is provided for informational purposes only and is based on estimates and preliminary data. The accuracy and completeness of this information are not guaranteed. EECL reserves the right to change the specifications and features of its products without notice.

Software

Our software suite seamlessly integrates with the module, providing a powerful and user-friendly interface for configuring and controlling the system. Compatible with C, LabView, and MATLAB, the software allows for effortless automation of complex tasks and real-time data acquisition. Users can set up power supplies, measurement configurations, and pulse parameters through an intuitive dashboard, with the ability to monitor all channels simultaneously. Advanced features include automated script execution, real-time graphing of voltage and current trends, and customizable trigger conditions for precise timing. The software also supports remote access via Ethernet or USB, enabling control from any networked location, making it ideal for both lab-based setups and large-scale distributed testing environments. Additionally, all data collected can be logged, exported, and analysed for detailed post-test reporting, streamlining workflows and improving efficiency.

Easy to Use
Portable
Value for Money

EECL Services

We have many customers who require a complete turnkey test solution.
We can implement new firmware commands to enable custom measurements to be completed at the hardware level.
If you require anything just a little bit different to what is here, please get in touch – we may be able to make or modify it for you.

Have a question or need assistance? We’re here to help!

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